Guide Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

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One of the factors that sky rockets fault simulation costs is the number of structural faults which need to be simulated at circuit-level. Criteria to partition the fault list in strata, and to identify representative faults are presented and discussed.

A fault representativeness metric is proposed, based on an error probability. The proposed methodology allows different tradeoffs between fault list compression and fault representation accuracy.

[PDF] Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits (Frontiers

These tradeoffs may be optimized for each test preparation phase. The fault representativeness vs. Although the methodology is presented in this paper using a very simple fault model, it may be easily extended to be used with more elaborate fault models. The proposed technique is a significant contribution to make mixed-signal fault simulation cost-effective as part of the production test preparation.